Original Concept & Design Overview
Core Principle: This digital capacitance meter operates on the "reverse frequency counter" principle. Instead of a fixed gate time measuring variable frequency, the unknown capacitor (Cx) controls the gate duration of a 555 timer, during which a stable clock frequency is counted by cascaded 7490 decade counters. The resulting count is proportional to capacitance.
Measurement Equation:
Count (N) = fclock × tgate
Where tgate = 1.1 × Rx × Cx
Solution: Cx = (N × 1.1) / (fclock × Rx)
Key Components:
- 2× NE555 timers (clock oscillator + gate generator)
- 4× 7490 decade counters (0000-9999 BCD count)
- 4× HP 5082-7300 7-segment(dot-matrix) displays (with latch)
- 1× CD4017 decade counter (sequence controller)
- Calibration potentiometer (10kΩ, clock timing network)
4017 Sequencing Mechanism
The CD4017 provides the critical COUNT → LATCH → CLEAR → REPEAT sequence, automatically advancing on each measurement completion.
Pin 16: +5V
Pin 8: GND
Pin 15: +5V (clock inhibit LOW)
Pin 14: CLK ← Gate 555 /Q (pin 6) - falling edge trigger
Pin 11: MR ← From Q3 output (pin 4) + 5V pull-up (10kΩ)
│
├─ 10kΩ ── +5V
│
└─ Q3 (pin 4)
Pin 2: Q0 ← COUNT ENABLE (to 7490 pins 1&2)
Pin 4: Q1 ← LATCH DISPLAYS (to 5082-7300 latch pins)
Pin 7: Q2 ← CLEAR COUNTERS (to 7490 MR pins 2&12)
Pin 10: Q3 ← RESET 4017 (connects back to MR pin 11)
| State |
4017 Output |
Action |
Duration |
| Q0 |
Pin 2 HIGH |
COUNT: 7490s enabled, incrementing during gate |
tgate = 1.1 × Rx × Cx |
| Q1 |
Pin 4 HIGH |
LATCH: Displays capture current count |
~50ms (hold time) |
| Q2 |
Pin 7 HIGH |
CLEAR: 7490s reset to 0000 |
~10ms (reset pulse) |
| Q3 |
Pin 10 HIGH |
RESET: 4017 returns to Q0, ready for next measurement |
Immediate |
Calibration System & Empirical Method
Primary Calibration: 10kΩ potentiometer in clock 555 timing network (pins 7-2/6), adjusting frequency from 50-200kHz for full range coverage (10pF to 10µF).
Clock 555 Calibration:
+5V ──[1kΩ fixed]── Pin7 ──[10kΩ POT]── Pin2/6 ──[1nF]── GND
│
Pin3 (Q) ──→ 100kHz to counters
Original Calibration Methodology
The builder employed a sophisticated empirical approach, rejecting inconsistent substitution box values in favor of real, labeled capacitors sorted by nominal value. Calibration targeted the minimax error across the measurement range:
Calibration Philosophy: Adjust pot position to minimize maximum error
Midpoint Strategy: Perfect accuracy at 1nF reference, accepting ±20% outliers at extremes
Result: Typical ±5% accuracy, excellent for 1980s discrete design
| Reference Cap |
Measured Value |
Error |
Notes |
| 10pF ceramic |
12pF (+20%) |
Outlier (low end) |
Stray capacitance dominant |
| 100pF ceramic |
105pF (+5%) |
Excellent |
|
| 1nF ceramic |
1000pF (0%) |
Reference point |
Calibration sweet spot |
| 10nF ceramic |
10.8nF (+8%) |
Good |
|
| 100nF ceramic |
120nF (+20%) |
Outlier (high end) |
Large value nonlinearity |
Corrections & Refinements
- 4017 Reset: Confirmed Q3 (pin 10) → MR (pin 11) with pull-up creates self-resetting three-state sequence
- Calibration Location: Clock 555 pot provides linear scaling across full range vs. gate timing's limited adjustment
- Trigger Mechanism: Gate 555 /Q falling edge precisely times 4017 advance at measurement completion
- Empirical Validation: Midpoint calibration methodology superior to theoretical values, compensating for breadboard parasitics
Key Insight: This design's elegance lies in its free-running nature—inserting Cx "tames" the system from erratic counting to stable measurement. The 4017's automatic sequencing eliminates timing complexity, while empirical calibration transforms component tolerances into a practical, accurate instrument.